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If you're stitching images together, that solves one of the primary problems with using these x-ray systems for semiconductor analysis.
I'm surprised it wasn't mentioned, was it tried and found insufficient?
I can confirm what the post affirms that panorama stitcher softwares are not able to do the job. But what I found was that the opencv Stitcher class can do this perfectly out of the box. Unfortunately, there was no existing gui for the class at the time, so I quickly made one in 3 days: https://github.com/kwon-young/ImageStitcher
It would have been nice if the post had compared it's approach to the Stitcher class. Maybe the number of images or the size of the final image or the stitching error control cannot be sufficiently controled with the Stitcher class ?